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• p163 Epitaxial Layers Grown with HCl Addition: A Comparison with the Standard Process
  Authors: Francesco La Via, G. Galvagno, A. Firrincieli, Fabrizio Roccaforte, Salvatore Di Franco, Alfonso Ruggiero, Milo Barbera, Ricardo Reitano, Paolo Musumeci, Lucia Calcagno, Gaetano Foti, Marco Mauceri, Stefano Leone, Giuseppe Pistone, F. Portuese, Giuseppe Abbondanza, Giovanni Abagnale, Gian Luca Valente, Danilo Crippa
• p179 SiC-4H Epitaxial Layer Growth Using Trichlorosilane (TCS) as Silicon Precursor
  Authors: Stefano Leone, Marco Mauceri, Giuseppe Pistone, Giuseppe Abbondanza, F. Portuese, Giovanni Abagnale, Gian Luca Valente, Danilo Crippa, Milo Barbera, Ricardo Reitano, Gaetano Foti, Francesco La Via
• p199 Optimisation of Epitaxial Layer Growth by Schottky Diodes Electrical Characterization
  Authors: Francesco La Via, G. Galvagno, A. Firrincieli, Fabrizio Roccaforte, Salvatore Di Franco, Alfonso Ruggiero, Lucia Calcagno, Gaetano Foti, Marco Mauceri, Stefano Leone, Giuseppe Pistone, Giuseppe Abbondanza, F. Portuese, Giovanni Abagnale, Gian Luca Valente, Danilo Crippa
• p93 Film Morphology and Process Conditions in Epitaxial Silicon Carbide Growth via Chlorides Route
  Authors: Maurizio Masi, Alessandro Veneroni, A. Fiorucci, Francesco La Via, Gaetano Foti, Marco Mauceri, Stefano Leone, Giuseppe Pistone, G. Condorelli, Giuseppe Abbondanza, Gian Luca Valente, Danilo Crippa
• p137 Optimisation of Epitaxial Layer Growth with HCl Addition by Optical and Electrical Characterization
  Authors: Lucia Calcagno, Gaetano Izzo, G. Litrico, G. Galvagno, A. Firrincieli, Salvatore Di Franco, Marco Mauceri, Stefano Leone, Giuseppe Pistone, G. Condorelli, F. Portuese, Giuseppe Abbondanza, Gaetano Foti, Francesco La Via
• p157 Very High Growth Rate Epitaxy Processes with Chlorine Addition
  Authors: Francesco La Via, Stefano Leone, Marco Mauceri, Giuseppe Pistone, G. Condorelli, Giuseppe Abbondanza, F. Portuese, G. Galvagno, Salvatore Di Franco, Lucia Calcagno, Gaetano Foti, Gian Luca Valente, Danilo Crippa
• p171 Carbonization Study of Different Silicon Orientations
  Authors: Andrea Severino, Corrado Bongiorno, Stefano Leone, Marco Mauceri, Giuseppe Pistone, G. Condorelli, Giuseppe Abbondanza, F. Portuese, Gaetano Foti, Francesco La Via
• p255 Ion-Irradiation Effect on the Ni/SiC Interface Reaction
  Authors: Fabrizio Roccaforte, Lucia Calcagno, Paolo Musumeci, Francesco La Via
• p655 Quantitative High-Resolution Two-Dimensional Profiling of SiC by Scanning Capacitance Microscopy
  Authors: Vito Raineri, Filippo Giannazzo, Lucia Calcagno, Paolo Musumeci, Fabrizio Roccaforte, Francesco La Via
• p893 Electrical Characterization of Nickel Silicide Contacts on Silicon Carbide
  Authors: Fabrizio Roccaforte, Francesco La Via, Vito Raineri, Paolo Musumeci, Lucia Calcagno