Papers by keyword «Residual Stress»
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The Cross Correlation Method: A Useful Tool for Peak Shift Determination in XSE
Authors: V.R. Vosberg, W. Fischer, W.J. Quadakkers
Keywords: Aluminum, Layers, Residual Stress, Scales, X-Ray
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New Opportunities in the Texture and Stress Field by the Whole Pattern Analysis
Authors: Maurizio Ferrari, Luca Lutterotti, Siegfried Matthies, P. Polonioli, H.R. Wenk
Keywords: Elastic Modulus, ODF Calculation, Residual Stress, Rietveld Method, Texture, WIMV
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Equipment for Residual Stress Measurements with the High Resolution Fourier Diffractometer: Present Status and Prospects
Authors: A.M. Balagurov, G.D. Bokuchava, Jürgen Schreiber, Yu. V. Taran
Keywords: Instrumentation, Residual Stress
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Analysis of Residual Stress Gradients in Thin Films Using SEEMANN-BOHLIN-X-Ray Diffraction
Authors: K. Fischer, H. Oettel
Keywords: Arc Evaporation, Electrical Contacts, Hard Coating, Magnetron-Sputtering, Residual Stress, SEEMANN-BOHLIN-Focusing, Thin Film, Titanium Nitride, X-Ray Diffraction (XRD)
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An Analysis of the Influence of Crystallographic Texture on Residual Stress Estimation for Metallic Films and Coatings
Authors: I. Iordanova, D. Neov, K.S. Forcey, H. Heitzek, R. Bezdushnyi
Keywords: Residual Stress, Sprayed Coatings, Texture, Thin Film
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Residual Stress in Ti(C,N) Coatings on HSS Substrate
Authors: F. Arrando, J. Bassas, X. Alcobé, Jaume Esteve
Keywords: Residual Stress
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Neutron and X-Ray Diffraction Measurements of Residual Stresses in a Shape Welded Steel Tube
Authors: Yu. V. Taran, Jürgen Schreiber
Keywords: Diffraction, Neutron, Residual Stress, Steel, Welding, X-Ray
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Residual Stress in Diamond Coatings by Synchrotron Radiation XRD
Authors: Paolo Scardi, Matteo Leoni, V. Sessa, M.L. Terranova, G. Cappuccio
Keywords: Diamond, Hot Filament Chemical Vapor Deposition (HFCVD), Residual Stress, Synchrotron Radiation, Thin Film, X-Ray Diffraction (XRD)
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Residual Stress in Plasma-Sprayed Ceramic Coatings
Authors: W. Fischer, H. Gruhn, W. Malléner
Keywords: Boron Carbide, Ceramic Coating, Plasma Spraying, Residual Stress, Zirconia
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Residual Stress of Monoclinic Zircon Obtained by X-Ray Diffraction in ZY4 Oxidized Cladding Tubes
Authors: Th. Jacquot, Ronald Guillén, Manuel François, B. Bourniquel, J. Senevat
Keywords: Residual Stress, Texture, Tube, X-Ray Diffraction (XRD), Zircaloy 4, Zircon
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